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Publications and Presentations

We manage a database of papers and presentations based on data aquired or analyzed with GXSM. All Gxsm users are invited to use this place to present there paper(s), if GXSM was of any use for it.

Sorry, write access to this database is now prohibited due to missuse. Please submit any suggested paper listings to one of the GXSM administrators by Email.

Notes:

This database is quite incomplete at this time, please help to make it more complete by adding your papers and presentations, you will make the GXSM community more happy. By default only publications are listed.

To expand the full length abstract, click on the title.

Filter options for experts: &filter=author, pfilter and prfilter are possible, example:
Show all Presentations of author "zahl", see URL of this link.

This allows you to use the service to present just your (replace "yourname" below) papers using a proper link with filter setting like this to show only your papers:

	     <a href="http://gxsm.sourceforge.net/index.php?
content=papersection&filter=yourname"> show my GXSM related papers </a>

Browse All | Add a Paper | Edit Paper | Paper Admin

[1]
A. Klust, R. Kayser, and J. Wollschläger
Growth kinetics of CaF2/Si(111) for a two-step deposition
Phys. Rev. B , 62 (3), p.2158 (2000).
[2]
A. Klust, H. Pietsch, and J. Wollschläger
Growth of CaF2 on Si(111): Imaging of the CaF Interface by Friction Force Microscopy
Appl. Phys. Lett. , 73 (14), p.1967 (1998).
[3]
J. Wollschläger, T. Hildebrandt, R. Kayser, J. Viernow, A. Klust, J. Bätjer, A. Hille, T. Schmidt, and J. Falta
Effects of electron irradiation on the structure and morphology of CaF2/Si(111)
Appl. Surf. Sci. , 127, p.309 (2000).
[4]
A. Meier, P. Zahl, and M. Horn-von Hoegen
nm-Regelung mit DSP-Karte
Elektronik Information , 9, p.84-85 (1996).
[5]
A. Meier, P. Zahl, and M. Horn-von Hoegen
DSP regelt im nm-Bereich.
Design & Elektronik , 1, p.54-55 (1997).
[6]
A. Meier, P. Zahl, R. Vockenroth, and M. Horn-von Hoegen
Step arrangement control of vicinal Si (001) by Ag adsorption.
Appl. Surf. Sci. , 123-124, p.694-698 (1998).
[7]
R. Hild, F.-J. Meyer zu Heringdorf, P. Zahl, and M. Horn von Hoegen
Au induced regular ordered striped domain wall structure of a (5x3) reconstruction on Si(001) studied by STM and SPA-LEED.
Surf. Sci. , 454-456, p.851-855 (2000).
[8]
P. Zahl, P. Kury, and M. Horn-von Hoegen
Interplay of surface morphology, strain relief, and surface stress during surfactant mediated epitaxy of Ge on Si.
Appl. Phys. A (Mat. Sci. Proc.) (5), p.481-488 (1999).
[9]
E. Sutter, P. Sutter, P. Zahl, P.Rugheimer, M. G. Lagally
Spontaneous Transition from Epitaxially Constrained to Equilibribum Ge Nanocrystals on Silicon-on-insulator(100)
Surf. Sci. , 532-535, p.785-788 (2003).
[10]
A. Klust
Struktur und Morphologie dünner CaF2-Schichten auf Si
Logos verlag Berlin (2001).
Notes: Dissertation/PhD thesis
[11]
J. Wollschläger, A. Klust, and H. Pietsch
Inhomogeneous growth of CaF2 adlayers on Si(111) at intermediate temperatures
Appl. Surf. Sci. , 123/124, p.496 (1998).
[12]
J. Wollschläger, H. Pietsch, and A. Klust
Competition between terrace and step nucleation: epitaxy of CaF2 on vicinal Si(111) studied by atomic force microscopy
Appl. Surf. Sci. , 130-132, p.29 (1998).
[13]
J. Wollschläger, H. Pietsch, R. Kayser, and A. Klust
Annealing of CaF2 adlayers grown on Si(111): investigations of the morphology by atomic force microscopy
Thin Solid Films , 336, p.120 (1998).
[14]
Percy Zahl
Oberflächenspannung auf Si(111): Heteroepitaxie von Ge und CaF2 , Adsorption von H und Sb.
Logos Verlag Berlin, ISBN 3-89722-571-9 , 1, p.1-153 (2000).
Notes: Dissertation/PhD Thesis - 12/2000
[15]
M. Horn-von Hoegen, F.-J. Meyer zu Heringsorf, R. Hild, P. Zahl, T. Schmidt, and E. Bauer
Au-induced giant faceting of vicinal si(001).
Surf. Sci. , 433-435, p.475-480 (1999).
[16]
R. Hild, F.-J. Meyer zu Heringdorf, P. Zahl, and M. Horn von Hoegen
Au induced regular ordered striped domain wall structure of a (5x3) reconstruction on Si(001) studied by STM and SPA-LEED.
Surf. Sci. , 454-456, p.851-855 (2000).
[17]
P. Zahl and M. Horn-von Hoegen
Third generation conical spot profile analysing low-energy electron diffraction
Rev. Sci. Inst. , 73 (8), p.2958 (2002).
Notes: Download paper from Rev.Sci.Inst here: PDF (745kB)
[18]
P.Zahl, M.Bierkandt, S.Schröder, A.Klust
The flexible and modern open source scanning probe microscopy software package Gxsm
Rev. Sci. Instr. , 74 (3), p.1222 (2003).
[19]
P. Sutter, P. Zahl, E. Sutter, and J. E. Bernard
Energy-Filtered Scanning Tunneling Microscopy using a Semiconductor Tip
Physical Review Letters , 90, p.166101 (2003).
Notes: AIP Bulletin: "Physics News Updates": "Color Filtering" at the Atomic Level See Images here!
[20]
P. Sutter, J. Palmer, P. Zahl, E. Sutter
Semiconductor tips with engineered electronic structure for spectroscopic scanning tunneling microscopy
Surf. Sci. , 532-535, p.1166-1170 (2003).
Notes: Author Keywords: Scanning tunneling microscopy; Scanning tunneling spectroscopies; Surface electronic phenomena; Indium arsenide; Graphite
[21]
P. Sutter, I. Schick, W. Ernst, and E. Sutter
Initial Surface Roughening in Ge/Si(001) Heteroepitaxy Driven by Step-Vacancy Line Interaction
Phys. Rev. Lett. , 91 (17), p.176102 (2003).
[22]
P. Sutter, E. Sutter, and T. R. Ohno
High-resolution mapping of nonuniform carrier transport at contacts to polycrystalline CdTe/CdS solar cells
Appl. Phys. Lett. , 84 (12), p.2100-2102 (2004).
Notes: Department of Physics, Colorado School of Mines, Golden, Colorado 80401
[23]
E. Sutter, P. Sutter, and J. E. Bernard
Extended shape evolution of low mismatch Si_ 1–x Ge_x alloy islands on Si(100)
Appl. Phys. Lett. , 84 (13), p.2262-2264 (2004).
Notes: Department of Physics, Colorado School of Mines, Golden, Colorado 80401
[24]
P. Kury, P. Zahl and Horn-von Hoegen
Precise calibration for surface stress induced optical deflection measurements
Rev. Sci. Instrum. , 75 (6), p.2211-2212 (2004).
Notes: (DOI: 10.1063/1.1753682)
[25]
P. Kury, P. Zahl and M. Horn-von Hoegen
Direct observation of reconstruction induced changes of surface stress for Sb on Si(111)
Anal Bioanal Chem , 379, p.582-587 (2004).
Notes: Special Issue Paper
[26]
Percy Zahl, Martin Bammerlin, Gerhard Meyer, and Reto R. Schlittler
All-in-one static and dynamic nanostencil atomic force microscopy/scanning tunneling microscopy system
Rev. Sci. Instrum. , 76, p.023707 (2005).
Notes: Online Link
[27]
Deiter, Carsten
STM-Untersuchungen zum Wachstum ultrad"unner CaF2-Schichten - STM-Investigation on the Growth of thin CaF2-Films
Diplomarbeit, Universit"at Hannover (2001).
[28]
Deiter, Carsten
STM-Untersuchungen zum Wachstum ultrad"unner CaF2-Schichten - STM-Investigation on the Growth of thin CaF2-Films
Diplomarbeit, Universit (2001).
[29]
E. Muller, E. Sutter, and P. Zahl (Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973), C. V. Ciobanu (Division of Engineering, Colorado School of Mines, Golden, Colorado 80401), P. Sutter (Center for Functional Nanomaterials, Brookhaven National Laboratory, Upton, New York 11973)
Short-range order of low-coverage Ti/Al(111): Implications for hydrogen storage in complex metal hydrides
Appl. Phys. Lett. , 90, p.151917 (2007).

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